Electrochemical Etching Apparatus
Keithley™ 2460 Sourcemeter, with Labview™ computer interface. This is a multi-purpose programmable power supply (Source-Measure Unit, or SMU) that can source and measure current and voltage (Max Voltage: 100 V; Max Current: 7 A). In the MCF, the instrument is configured to perform two-electrode electrochemical anodization. Primarily used to prepare porous silicon films, microparticles, and nanoparticles by electrochemical anodization, it can also be used to prepare mesoporous alumina, and to perform electroplating or electrocorrosion processes. The Labview™ program interfaced to the unit allows generation of user-defined current-time waveforms that can be used to fabricate photonic crystals, Bragg stacks, microcavities, Fabry-Perot layers, microparticles, and nanoparticles (including porous silicon quantum dots). The SMU and computer are configured on a wheeled cart that can be transported to the user’s location if needed. Facility also has available a Keithley™ 2651A Sourcemeter available, which can source currents up to 50 Amperes.
SOP: Download a .pdf file of the Standard Operating Procedure for this instrument
Hourly rate: UC Users: $25 • non-UC Users: $36.25
Location: Pacific Hall room 4229 • UC San Diego Main Campus • 9500 Gilman Drive, La Jolla, CA 92093-0358 USA
The UC San Diego MRSEC-MCF is a user and service facility associated with the NSF-funded UC San Diego Materials Research Science and Engineering Center, dedicated to materials characterization, assays, and sample processing.
We ask that any publications or presentations acknowledge use of these MRSEC-supported facilities with the following statement:
“The authors acknowledge the use of facilities and instrumentation supported by NSF through the UC San Diego Materials Research Science and Engineering Center (UCSD MRSEC), grant # DMR-2011924”